Two-point resistances in Archimedean resistor networks

Frederic Perrier (1) , Frédéric Girault (1)

1 IPGP (UMR_7154) - Institut de Physique du Globe de Paris

The rise of novel materials such as graphene compounds or carbon nanotubes recently revived the interest on the role of symmetries upon electrical properties. Among possible solids, symmetrical polytopes, widely realized in natural and artificial matter, deserve particular attention. When equal resistors are attached between neighbouring nodes of Perfect (Platonic) solids (PS) along the edges, the two-point resistance between any pair of nodes was established in the 1990s by van Steenwijk using an elegant and efficient method. Using van Steenwijk's method, Moddy and Aravind subsequently derived the resistance values for two Archimedean and two Catalan solids. Here, with the same method, we derive the exact expression for the two-point resistance between any two nodes for resistor networks made of equal resistors placed along the edges of the thirteen Archimedean solids (AS). While the calculation remains elementary for the simplest AS, a dedicated method using computer assistance was developed for the Snub Cube, the Snub Dodecahedron and the three AS with three different rotation symmetries (the Great Rhombicuboctahedron, the Small Rhombicosidodecahedron and the Great Rhombicosidodecahedron). The largest resistance value (191/90) is obtained between the two opposite nodes of the Truncated Dodecahedron, and the second largest (42815/21114) is obtained between the two opposite nodes of the Great Rhombicosidodecahedron. The smallest resistance value (14137/38016) is obtained between some of the neighbouring nodes of the Snub Cube, whereas the resistance between neighbouring nodes of the Icosahedron (11/30) is slightly smaller. Some general symmetry relations between two-point resistances in AS networks are also derived, as well as some relations with two-point resistances in PS networks. The complete set of exact two-point resistance values for PS and AS networks can be used to check numerical codes or to evaluate the capacity of regular solids to provide appropriate models for given experimental situations.

Mots clés: Resistive networks; Two-point resistance; Regular polytopes; Rotational invariance; Van Steenwijk's method

Domaines: Physique [physics]

Frederic Perrier, Frédéric Girault. Two-point resistances in Archimedean resistor networks. Results in Physics, 2022, 36, pp.105443. ⟨10.1016/j.rinp.2022.105443⟩. ⟨insu-03643018⟩