Skip to Main content Skip to Navigation
Books

Volume 9 : Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

Abstract : This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset.

Document type :
Books
Complete list of metadatas

https://hal-insu.archives-ouvertes.fr/insu-03084056
Contributor : Catherine Cardon <>
Submitted on : Sunday, December 20, 2020 - 1:47:33 PM
Last modification on : Tuesday, December 22, 2020 - 3:33:56 AM

File

Preface Volume 9.pdf
Files produced by the author(s)

Identifiers

  • HAL Id : insu-03084056, version 1

Citation

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami. Volume 9 : Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley - Iste, 246 p., 2021, 9781786306401. ⟨insu-03084056⟩

Share

Metrics

Record views

85

Files downloads

10