Volume 9 : Applications and Metrology at Nanometer Scale 1

Pierre-Richard Dahoo (1) , Philippe Pougnet (2) , Abdelkhalak El Hami (3)

1 PLANETO - LATMOS
2 Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology
3 INSA Rouen Normandie - Institut national des sciences appliquées Rouen Normandie

This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset.


Domaines: Sciences de l'ingénieur [physics]

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami. Volume 9 : Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley - Iste, 246 p., 2021, 9781786306401. ⟨insu-03084056⟩