Skip to Main content Skip to Navigation
Journal articles

Identification of montmorillonite particle edge orientations by atomic-force microscopy

Abstract : Statistical information on the edge surface area and edge crystallographic orientation of clay nanoparticle surfaces is essential for proper accounting of the protonation-deprotonation reactions as a part of mechanistic surface complexation models. A combination of atomic-force microscopy (AFM) measurements and molecular dynamics computer simulations made it possible to quantify the relative contributions of the most frequently occurring montmorillonite edge surfaces to the total edge surface area. Edge surfaces normal to the [110] and [010] crystallographic directions are found to be the most abundant (~60% and ~20%, respectively), in agreement with previous estimations.
Complete list of metadatas

https://hal-insu.archives-ouvertes.fr/insu-02476314
Contributor : Nathalie Pothier <>
Submitted on : Wednesday, February 12, 2020 - 5:21:06 PM
Last modification on : Wednesday, September 23, 2020 - 8:10:02 AM
Long-term archiving on: : Wednesday, May 13, 2020 - 6:21:48 PM

File

CLAY13803-revised-clean.pdf
Files produced by the author(s)

Identifiers

Citation

Sergey Kraevsky, Christophe Tournassat, Marylène Vayer, Fabienne Warmont, Sylvain Grangeon, et al.. Identification of montmorillonite particle edge orientations by atomic-force microscopy. Applied Clay Science, Elsevier, 2020, 186, 105442 (8 p.). ⟨10.1016/j.clay.2020.105442⟩. ⟨insu-02476314⟩

Share

Metrics

Record views

252

Files downloads

43