Identification of montmorillonite particle edge orientations by atomic-force microscopy - INSU - Institut national des sciences de l'Univers Access content directly
Journal Articles Applied Clay Science Year : 2020

Identification of montmorillonite particle edge orientations by atomic-force microscopy

Abstract

Statistical information on the edge surface area and edge crystallographic orientation of clay nanoparticle surfaces is essential for proper accounting of the protonation-deprotonation reactions as a part of mechanistic surface complexation models. A combination of atomic-force microscopy (AFM) measurements and molecular dynamics computer simulations made it possible to quantify the relative contributions of the most frequently occurring montmorillonite edge surfaces to the total edge surface area. Edge surfaces normal to the [110] and [010] crystallographic directions are found to be the most abundant (~60% and ~20%, respectively), in agreement with previous estimations.
Fichier principal
Vignette du fichier
CLAY13803-revised-clean.pdf (969.32 Ko) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

insu-02476314 , version 1 (12-02-2020)

Identifiers

Cite

Sergey Kraevsky, Christophe Tournassat, Marylène Vayer, Fabienne Warmont, Sylvain Grangeon, et al.. Identification of montmorillonite particle edge orientations by atomic-force microscopy. Applied Clay Science, 2020, 186, 105442 (8 p.). ⟨10.1016/j.clay.2020.105442⟩. ⟨insu-02476314⟩
191 View
111 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More