Books
Year : 2016
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https://hal-insu.archives-ouvertes.fr/insu-01333788
Submitted on : Sunday, June 19, 2016-3:13:25 PM
Last modification on : Friday, March 24, 2023-2:53:02 PM
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- HAL Id : insu-01333788 , version 1
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Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El-Hami. Nanometer-scale Defect Detection Using Polarized Light. ISTE Editions, 200 p., 2016, 10 1848219369. ⟨insu-01333788⟩
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