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Books Year : 2016

Nanometer-scale Defect Detection Using Polarized Light

Pierre-Richard Dahoo
  • Function : Author
  • PersonId : 921036
PLANETO - LATMOS
Philippe Pougnet
  • Function : Author
Valeo Powertrain Systems
Abdelkhalak El-Hami
  • Function : Author
  • PersonId : 923151
Laboratoire de mécanique de Rouen

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https://hal-insu.archives-ouvertes.fr/insu-01333788

Submitted on : Sunday, June 19, 2016-3:13:25 PM

Last modification on : Friday, March 24, 2023-2:53:02 PM

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insu-01333788 , version 1 (19-06-2016)

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Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El-Hami. Nanometer-scale Defect Detection Using Polarized Light. ISTE Editions, 200 p., 2016, 10 1848219369. ⟨insu-01333788⟩

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INSU UPMC CNRS INSA-ROUEN LATMOS UVSQ COMUE-NORMANDIE UNIV-PARIS-SACLAY INSA-GROUPE SORBONNE-UNIVERSITE SU-SCIENCES GS-ENGINEERING GS-PHYSIQUE INSTITUT-SCIENCES-LUMIERE
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