Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver

Abstract : Spark Plasma Sintered (SPS) silver layers were studied by Spectroscopic Ellipsometry (SE) using an M-2000V spectroscopic ellipsometer from J. A. Woollam Co., Inc. which operate in rotating compensator mode
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https://hal-insu.archives-ouvertes.fr/insu-01314044
Contributor : Catherine Cardon <>
Submitted on : Tuesday, May 10, 2016 - 5:23:38 PM
Last modification on : Wednesday, May 15, 2019 - 3:41:11 AM

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  • HAL Id : insu-01314044, version 1

Citation

Christian Chong, Armelle Girard, Nadim Alayli, Frédéric Schoenstein, Pierre-Richard Dahoo. Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver. 7th International Conference on Spectroscopic Ellipsometry (ICSE-7), Jun 2016, Berlin, Germany. ⟨insu-01314044⟩

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