Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver

Christian Chong (1) , Armelle Girard (2, 3) , Nadim Alayli (1, 3) , Frédéric Schoenstein (4) , Pierre-Richard Dahoo (5, 2)

1 LISV - Laboratoire d'Ingénierie des Systèmes de Versailles
2 UVSQ - Université de Versailles Saint-Quentin-en-Yvelines
3 LEM - ONERA - CNRS - Laboratoire d'étude des microstructures [Châtillon]
4 LSPM - Laboratoire des Sciences des Procédés et des Matériaux
5 PLANETO - LATMOS

Spark Plasma Sintered (SPS) silver layers were studied by Spectroscopic Ellipsometry (SE) using an M-2000V spectroscopic ellipsometer from J. A. Woollam Co., Inc. which operate in rotating compensator mode

Domaines: Optique [physics.optics]; Physique des plasmas [physics.plasm-ph]

Christian Chong, Armelle Girard, Nadim Alayli, Frédéric Schoenstein, Pierre-Richard Dahoo. Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver. 7th International Conference on Spectroscopic Ellipsometry (ICSE-7), Jun 2016, Berlin, Germany. ⟨insu-01314044⟩