Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

Pierre-Richard Dahoo; Malika Khettab; Jorge Linares; Philippe Pougnet

doi:10.1016/B978-1-78548-013-3.50002-4

Book Sections Year : 2015

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

(1) , (2) , (3) , (4)

1
2
3
4

Pierre-Richard Dahoo

Function : Author

PLANETO - LATMOS

Malika Khettab

Function : Author

Laboratoire d'Ingénierie des Systèmes de Versailles

Jorge Linares

Function : Author

Laboratoire de magnétisme et d'optique de Versailles

Philippe Pougnet

Function : Author

Valeo Powertrain Systems

Domains

Instrumentation and Methods for Astrophysic [astro-ph.IM] Materials and structures in mechanics [physics.class-ph]

Catherine Cardon : Connect in order to contact the contributor

https://hal-insu.archives-ouvertes.fr/insu-01155342

Submitted on : Tuesday, May 26, 2015-2:47:23 PM

Last modification on : Friday, March 24, 2023-2:53:00 PM

Dates and versions

insu-01155342 , version 1 (26-05-2015)

Identifiers

HAL Id : insu-01155342 , version 1
DOI : 10.1016/B978-1-78548-013-3.50002-4

Cite

Pierre-Richard Dahoo, Malika Khettab, Jorge Linares, Philippe Pougnet. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability, Elsevier, Chapter 2, 2015, 978-1-78548-013-3. ⟨10.1016/B978-1-78548-013-3.50002-4⟩. ⟨insu-01155342⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

INSU UPMC CNRS LATMOS UVSQ LISV UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES GS-COMPUTER-SCIENCE GS-PHYSIQUE GS-SPORT-HUMAN-MOVEMENT INSTITUT-SCIENCES-LUMIERE

225 View

0 Download

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

Domains

Dates and versions

Identifiers

Cite

Export

Collections

Altmetric

Share