Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

Pierre-Richard Dahoo; Malika Khettab; Jorge Linares; Philippe Pougnet

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

Pierre-Richard Dahoo ¹ Malika Khettab ² Jorge Linares ³ Philippe Pougnet ⁴

1 IMPEC - LATMOS

LATMOS - Laboratoire Atmosphères, Milieux, Observations Spatiales

2 LISV - Laboratoire d'Ingénierie des Systèmes de Versailles

3 LMOV - Laboratoire de magnétisme et d'optique de Versailles

4 Valeo Powertrain Systems

Document type :

Book sections

Domain :

Sciences of the Universe [physics] / Astrophysics [astro-ph] / Instrumentation and Methods for Astrophysic [astro-ph.IM]

Engineering Sciences [physics] / Mechanics [physics.med-ph] / Materials and structures in mechanics [physics.class-ph]

Complete list of metadatas

https://hal-insu.archives-ouvertes.fr/insu-01155342
Contributor : Catherine Cardon <>
Submitted on : Tuesday, May 26, 2015 - 2:47:23 PM
Last modification on : Tuesday, May 14, 2019 - 11:09:06 AM

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

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Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

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