Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

Pierre-Richard Dahoo 1 Malika Khettab 2 Jorge Linares 3 Philippe Pougnet 4
1 IMPEC - LATMOS
LATMOS - Laboratoire Atmosphères, Milieux, Observations Spatiales
2 LISV - Laboratoire d'Ingénierie des Systèmes de Versailles
3 LMOV - Laboratoire de magnétisme et d'optique de Versailles
4 Valeo Powertrain Systems
Document type :
Book sections
Complete list of metadatas
https://hal-insu.archives-ouvertes.fr/insu-01155342
Contributor : Catherine Cardon <>
Submitted on : Tuesday, May 26, 2015 - 2:47:23 PM
Last modification on : Friday, January 10, 2020 - 3:42:29 PM

Identifiers

  • HAL Id : insu-01155342, version 1

Collections

INSU | CNRS | UPMC | UVSQ | LATMOS | LISV | UNIV-PARIS-SACLAY | SORBONNE-UNIVERSITE | SU-SCIENCES

Citation

Pierre-Richard Dahoo, Malika Khettab, Jorge Linares, Philippe Pougnet. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability, Elsevier, Chapter 2, 2015, 978-1-78548-013-3. ⟨insu-01155342⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

318

Contact

Informations

CCSD