Reliability Prediction of embedded Electronic Systems: The FIDES Guide

Philippe Pougnet 1 Franck Bayle 2 Hichame Maanane 3 Pierre-Richard Dahoo 4
3 Thales Air Systems
Thales Air Systems
4 IMPEC - LATMOS
LATMOS - Laboratoire Atmosphères, Milieux, Observations Spatiales
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https://hal-insu.archives-ouvertes.fr/insu-01155286
Contributor : Catherine Cardon <>
Submitted on : Tuesday, May 26, 2015 - 1:57:15 PM
Last modification on : Tuesday, May 14, 2019 - 10:59:31 AM

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  • HAL Id : insu-01155286, version 1

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Philippe Pougnet, Franck Bayle, Hichame Maanane, Pierre-Richard Dahoo. Reliability Prediction of embedded Electronic Systems: The FIDES Guide. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability, Elsevier, Chapter 8, 2015, 978-1-78548-013-3. ⟨insu-01155286⟩

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