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Book Sections Year : 2015

Highly Accelerated Testing

Philippe Pougnet
  • Function : Author
Valeo Powertrain Systems
Pierre-Richard Dahoo
  • Function : Author
PLANETO - LATMOS
Jean-Loup Alavarez
  • Function : Author
Sté MB Electronique

Domains

Instrumentation and Methods for Astrophysic [astro-ph.IM] Materials and structures in mechanics [physics.class-ph]

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https://hal-insu.archives-ouvertes.fr/insu-01154806

Submitted on : Saturday, May 23, 2015-6:01:52 PM

Last modification on : Friday, March 24, 2023-2:53:00 PM

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insu-01154806 , version 1 (23-05-2015)

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  • HAL Id : insu-01154806 , version 1

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Philippe Pougnet, Pierre-Richard Dahoo, Jean-Loup Alavarez. Highly Accelerated Testing. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 2. Analysis of Failures, Modeling, Simulation and Optimization, Elsevier, Chapter 1, 2015, ISBN : 978-1-78548-014-0. ⟨insu-01154806⟩

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INSU UPMC CNRS LATMOS UVSQ UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES GS-PHYSIQUE INSTITUT-SCIENCES-LUMIERE
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