Highly Accelerated Testing

Philippe Pougnet 1 Pierre-Richard Dahoo 2 Jean-Loup Alavarez 3
2 IMPEC - LATMOS
LATMOS - Laboratoire Atmosphères, Milieux, Observations Spatiales
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https://hal-insu.archives-ouvertes.fr/insu-01154806
Contributor : Catherine Cardon <>
Submitted on : Saturday, May 23, 2015 - 6:01:52 PM
Last modification on : Tuesday, May 14, 2019 - 11:08:43 AM

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  • HAL Id : insu-01154806, version 1

Citation

Philippe Pougnet, Pierre-Richard Dahoo, Jean-Loup Alavarez. Highly Accelerated Testing. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 2. Analysis of Failures, Modeling, Simulation and Optimization, Elsevier, Chapter 1, 2015, ISBN : 978-1-78548-014-0. ⟨insu-01154806⟩

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