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Journal Articles Comptes Rendus. Palevol Year : 2010

Synchrotron X-Ray imaging of inclusions in amber

Mike Archer
  • Function : Author
Phil Creaser
  • Function : Author
Xavier Delclos
  • Function : Author
Didier Neraudeau
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  • PersonId : 840690
Vincent Perrichot
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  • PersonId : 903635
Et Al.
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Over the past six years, organic inclusions preserved in amber samples from outcrops worldwide have been discovered and imaged in 3D using propagation phase contrast based X-ray synchrotron imaging techniques at the European Synchrotron Radiation Facility (ESRF). A brief description of the techniques and protocols used for detecting and 3D non-destructive imaging of amber inclusions is provided. The latest results from the major amber projects in the ESRF are given, illustrating the increasing utility of the imaging capabilities of X-ray synchrotron phase contrast microtomography.

Dates and versions

insu-00605048 , version 1 (30-06-2011)



Carmen Soriano, Mike Archer, Dany Azar, Phil Creaser, Xavier Delclos, et al.. Synchrotron X-Ray imaging of inclusions in amber. Comptes Rendus. Palevol, 2010, 9 (6-7), pp.361-368. ⟨10.1016/j.crpv.2010.07.014⟩. ⟨insu-00605048⟩
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