3D chemical imaging based on a third-generation synchrotron source

Pierre Bleuet 1, 2 Patrice Gergaud 2 Laurence Lemelle 3 R. Tucoulou 1 Peter Cloetens 1 Jean Susini 1 G. Delette 4 Alexandre Simionovici 5
1 ESRF - European Synchrotron Radiation Facility
2 CEA-LETI - Laboratoire d'Electronique et des Technologies de l'Information
3 ENS Lyon - École normale supérieure - Lyon
4 LITEN - Laboratoire d'Innovation pour les Technologies des Energies Nouvelles et les nanomatériaux
5 LGCA - Laboratoire de Géodynamique des Chaines Alpines
Abstract : Data acquisition and reconstruction for tomography have been extensively studied for the past 30 years, mainly for medical diagnosis and non-destructive testing. In these fields, imaging is typically limited to sample morphology. However, in many cases, that is insufficient, and 3D chemical imaging becomes essential. This review highlights synchrotron X-ray fluorescence tomography, a well-established non-destructive technique that makes tomography richer by reconstructing the quantitative elemental distribution within samples down to the micrometer scale or even less. We compare the technique to others and illustrate it through results covering different scientific applications.
Keywords : Characterization Chemical imaging Elemental distribution Fluorescence Microanalysis Microscopy Reconstruction Synchrotron Tomography X-ray
Type de document :
Article dans une revue
Trends in Analytical Chemistry, Elsevier, 2010, 29, pp.518-527. 〈10.1016/j.trac.2010.02.011〉
Liste complète des métadonnées
https://hal-insu.archives-ouvertes.fr/insu-00549092
Contributeur : Pascale Talour <>
Soumis le : mardi 21 décembre 2010 - 11:37:19
Dernière modification le : samedi 6 février 2016 - 01:06:05

Identifiants

Collections

INSU | CEA | ENS-LYON | OSUG | UGA | DRT | IFSTTAR | ISTERRE

Citation

Pierre Bleuet, Patrice Gergaud, Laurence Lemelle, R. Tucoulou, Peter Cloetens, et al.. 3D chemical imaging based on a third-generation synchrotron source. Trends in Analytical Chemistry, Elsevier, 2010, 29, pp.518-527. 〈10.1016/j.trac.2010.02.011〉. 〈insu-00549092〉

Exporter

BibTeX TEI DC DCterms EndNote
Rdf

Partager

Métriques

Consultations de la notice

165

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD