Skip to Main content Skip to Navigation
Journal articles

Synchrotron X-Ray Microfluorescence and Microspectroscopy: Application and Perspectives in Materials Science

Abstract : Recent developments in synchrotron storage ring technology, insertion device design and X-ray optics provide polarized photon beams with unprecedented intensity and brilliance on a microscopic area. Various arrangements allow micrometer size hard X-ray beams with enough flux to undertake elemental mapping of trace elements then easily associated with micro-diffraction or micro-extended X-ray absorption fine structure studies on the very same sample region of interest. These analytical possibilities and the sensitivity and accuracy of the achieved analysis can complement or surpass other available instrumental micro-analytical methods. Such microprobes are becoming a very interesting tool for material characterization.
Document type :
Journal articles
Complete list of metadatas

Cited literature [51 references]  Display  Hide  Download

https://hal-insu.archives-ouvertes.fr/insu-00402756
Contributor : Pascale Talour <>
Submitted on : Wednesday, February 13, 2019 - 9:54:20 AM
Last modification on : Friday, July 10, 2020 - 7:58:40 AM
Long-term archiving on: : Tuesday, May 14, 2019 - 2:59:37 PM

File

bohic_vol60n6.pdf
Publication funded by an institution

Identifiers

Collections

Citation

Sylvain Bohic, Alexandre Simionovici, Xavier Biquard, G. Martinez-Criado, Jean Susini. Synchrotron X-Ray Microfluorescence and Microspectroscopy: Application and Perspectives in Materials Science. Oil & Gas Science and Technology - Revue d'IFP Energies nouvelles, Institut Français du Pétrole, 2005, 60 (6), pp.979-993. ⟨10.2516/ogst:2005069⟩. ⟨insu-00402756⟩

Share

Metrics

Record views

281

Files downloads

345