High Resolution Spectroscopy on an X-ray Absorption Beamline

Jean-Louis Hazemann (1) , Olivier Proux (2) , Vivian Nassif (3) , Hervé Palancher (4) , Eric Lahera (2) , Cécile da Silva (1) , Aurélien Braillard , Denis Testemale (1) , Marie-Ange Diot (1) , Isabelle Alliot (3) , William Delnet (2) , A. Manceau (5) , Frédéric Gélébart (6) , Marc Morand (6) , Quentin Dermigny (6) , Abhay Shukla (7)

1 NEEL - MRS - Matériaux, Rayonnements, Structure
2 équipe FAME
3 SP2M - UMR 9002 - Service de Physique des Matériaux et Microstructures
4 Department for Nuclear Fuel Study
5 Environmental Geochemistry Group
6 IMPMC - Institut de minéralogie et de physique des milieux condensés
7 UPMC - Université Pierre et Marie Curie - Paris 6

Abstract A bent crystal spectrometer based on the Rowland circle geometry has been tested on the BM30b/FAME beamline at the European Synchrotron Radiation Facility. The energy resolution of the spectrometer (1.3eV at the Cu K1 energy, i.e. 8047.78eV) allows to perform different kinds of measurements, including X-ray Absorption Spectroscopy, Resonant Inelastic X-ray Scattering and X-ray Raman Scattering experiments. The simplicity of the experimental device makes it easily implemented on a classical X-ray absorption beamline.

Mots clés: X-ray absorption spectroscopy; high-resolution X-ray analyzer; inelastic X-ray scattering; bent crystal

Domaines: Instrumentations et Détecteurs [physics.ins-det]

Jean-Louis Hazemann, Olivier Proux, Vivian Nassif, Hervé Palancher, Eric Lahera, et al.. High Resolution Spectroscopy on an X-ray Absorption Beamline. Journal of Synchrotron Radiation, 2008, 16 (2), pp.283-292. ⟨10.1107/S0909049508043768⟩. ⟨insu-00709583⟩